Spectral Composition Analysis(SCA) uses the same low frequency EM scans used by SLI scans but for longer periods to build a 3D visualisation of the object.

Analysis of the reflection, diffraction and absorption of the scan is used to assess the composition of the scanned object. The system can typically determine the material type (metallic, mineral, organic, gaseous, liquid) and key datapoints such as density, temperature and even component elements.

Once a SCA scan has been completed to a minimum fidelity it is possible to overlay the approximate location of EM output onto the object to assist with analysis.

Console Panel

SCA scans are controlled from the SC-SCN01 Scan Analysis panel.